Athermal wavelength stability monitor using a detraction grating
US11231319B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 8, 2020 |
| Grant date | Jan 25, 2022 |
| Priority date | — |
| Expiry date | Sep 8, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/4215
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Configurations for a diffraction grating design that mitigates thermal wavelength shifts and corresponding methods thereof are disclosed. The wavelength stability monitoring system may include a planar waveguide that receives input light directed toward a diffraction grating. The diffraction grating may reflect the light back through the planar waveguide and to one or more detectors. The planar waveguide may include multiple materials, such as a first material and a second athermal material that is adjacent to the first material. The athermal material may mitigate thermal wavelength shifts of the light. The design of the athermal material may include targeting a ratio of the input and output path lengths across sets of input and output angles of light that pass through the first material and the second athermal material. In some examples, the output waveguides may be positioned to receive leakage modes of light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.