Systems and methods for determining a thickness of a nonaqueous phase liquid layer
US11231339B2 · kind B2 · utility
1Cited by
7References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2019 |
| Grant date | Jan 25, 2022 |
| Priority date | — |
| Expiry date | Jun 21, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL. The pressure transducer assembly can be configured to measure a first pressure associated with the pressure exerted by the first layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.