Inspection apparatus and inspection method thereof
US11231468B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 26, 2019 |
| Grant date | Jan 25, 2022 |
| Priority date | — |
| Expiry date | Mar 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Inspection apparatus is provided for inspecting a first electronic device and a second electronic device. The inspection apparatus includes a first signal transfer unit, a second signal transfer unit, a first signal output unit and a second signal output unit. The first signal transfer unit is adapted to receive a first input signal. The second signal transfer unit is adapted to receive a second input signal. The first signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a first output signal to inspect the first electronic device. The second signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a second output signal to inspect the second electronic device. The inspection apparatus can realize automatic inspection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.