Fault detection using breakpoint value-based fingerprints of failing regression test cases
US11232020B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 13, 2019 |
| Grant date | Jan 25, 2022 |
| Priority date | — |
| Expiry date | Dec 23, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3692
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods, and computer-readable media are described for utilizing breakpoint value-based fingerprints of failing regression test cases to determine specific components of a System Under Test (SUT) that are causing a fault such as specific lines of source code. A failing test case from a regression run is selected and fault localization and inverse combinatorics techniques are employed to generate a set of failing test cases around the selected failing test case. A set of test fingerprints corresponding to the set of failing test cases is compared to a set of test fingerprints corresponding to a set of passing test cases to determine breakpoints that are indicated as being encountered during execution of at least one failing test case and that are not encountered during execution of any of the passing test cases. Specific lines of source code that correspond to these breakpoints are then identified as causing the fault.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.