Crop yield prediction method and device based on multi-level variable analysis
US11232563B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 3, 2021 |
| Grant date | Jan 25, 2022 |
| Priority date | — |
| Expiry date | Mar 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30252
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a crop yield prediction method and device. The method includes: transmitting an image acquisition instruction to a preset aircraft terminal to acquire a ground image; transmitting a driving instruction at the same time, wherein a distance between a first rail vehicle and a second rail vehicle is inversely proportional to the driving time, a plurality of light channels are embedded between a first rail and a second rail, and a light transmittance of the light channels is able to be affected by the external environment to change; transmitting a light emitting instruction and recording initial data when multiple beams of light are emitted; transmitting a light receiving instruction and recording final data when the multiple beams of light are received; and inputting the ground image, the initial data and the final data into a crop yield prediction model for processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.