X-in-the-loop tests for self-driving motor vehicles
US11232654B2 · kind B2 · utility
0Cited by
1References
18Claims
0Family size
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Key dates
| Filing date | Apr 19, 2019 |
| Grant date | Jan 25, 2022 |
| Priority date | — |
| Expiry date | Dec 6, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/17
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer includes a processor and a memory, the memory including instructions executable by the processor to identify a diagnostic test to perform for a vehicle component, identify one of a plurality of XiL platforms on which to perform the diagnostic test, and perform the diagnostic test on the identified XiL platforms.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.