Patent · US Active

Method for measuring the flatness of a metal product and associated device

US11235365B2 · kind B2 · utility

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12References
12Claims
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Key dates

Filing dateNov 7, 2016
Grant dateFeb 1, 2022
Priority date
Expiry dateJan 31, 2038

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB21B2263/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and a device that performs the method for measuring the flatness of a metal product traveling on a path, the method includes measuring a first longitudinal tension measurement value (T1) with a measuring roller, determining a model of stress over the thickness of the metal product as a function of plastic or elastoplastic deformation of the product, calculating a correction factor for the longitudinal deformation according to the stress model, calculating a corrective value (T1′, T2′) for the first longitudinal tension measurement value (T1) at at least one evaluation point (M1, M2) as a function of the longitudinal deformation correction factor (Z1), and calculating a corrected flatness measurement value (PC) at at least one of the evaluation points.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.