Optical rejection photonic structures using two spatial filters
US11237326B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 23, 2018 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Jul 23, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated device and related instruments and systems for analyzing samples in parallel are described. The integrated device may include sample wells arranged on a surface of where individual sample wells are configured to receive a sample labeled with at least one fluorescent marker configured to emit emission light in response to excitation light. The integrated device may further include photodetectors positioned in a layer of the integrated device, where one or more photodetectors are positioned to receive a photon of emission light emitted from a sample well. The integrated device further includes one or more photonic structures positioned between the sample wells and the photodetectors, where the one or more photonic structures are configured to attenuate the excitation light relative to the emission light such that a signal generated by the one or more photodetectors indicates detection of photons of emission light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.