Use of error correction-based metric for identifying poorly performing data storage devices
US11237893B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2019 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Feb 14, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3034
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An approach to identifying poorly performing data storage devices (DSDs) in a data storage system, such as hard disk drives (HDDs) and/or solid-state drives (SSDs), involves retrieving and evaluating a respective set of log pages, such as SCSI Log Sense counters, from each of multiple DSDs. Based on each respective set of log pages, a value for a Quality of Service (QoS) metric is determined for each respective DSD, where each QoS value represents an average percentage of bytes processed without the respective DSD performing an autonomous error correction. In response to a particular DSD reaching a predetermined threshold QoS value, an in-situ repair may be determined for the particular DSD or the particular DSD may be added to a list of candidate DSDs for further examination, which may include an FRPH examination for suitably configured DSDs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.