Method and system for detecting anomalies in data labels
US11238365B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2017 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Nov 1, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/022
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present teaching relates to a method and system for validating labels of training data. A first group of data records associated with the training data are received, wherein each of the first group of data records includes a vector having at least one feature and a first label. For each of the first group of data records, a second label is determined based on the at least one feature in accordance with a first model. Thereafter, a loss based on the first label associated with the data record and the second label is obtained, and the data record having an incorrect first label is classified when the loss meets a pre-determined criterion. Upon classifying the data records, a sub-group of the first group of data records is generated, wherein each of the data records included in the sub-group has the incorrect first label.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.