Non linear predictive model for haptic waveform generation
US11238709B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2020 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Aug 1, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/016
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A system includes a sequencer that divides a reference waveform into reference sequences, a sequence adjuster, and a model that models non-linearities of a haptic rendering signal chain that includes a haptic transducer load and a driver to the load. For each reference sequence: the sequence adjuster transforms the reference sequence into a test sequence using one or more parameters (e.g., changes reference sequence amplitude and/or period), the model generates an output in response to the test sequence, an error signal is generated that measures a difference between the output and the reference sequence, and if the error signal is above a threshold the parameters are adjusted based on the error signal. These operations are repeated until the error signal is below the threshold in which case the test sequence becomes a selected sequence, which is then sent to the haptic rendering signal chain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.