System and method for x-ray compatible 2D streak camera for a snapshot multiframe imager
US11240433B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2020 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Apr 24, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/71
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure is directed to a snapshot multiframe imager having an aperture element having at least one aperture, an adjacently positioned random mask, an imaging element and a computer. The random mask has a plurality of micron scale apertures and receives light passing through the aperture element, which represents the spatial information from the scene being imaged, and generates a plurality of image frames encoded in a spatial domain. The imaging element may operate in a drift-scan mode receives the encoded image frames and generates a streaked pattern of electrons representing a plurality of images of the scene at a plurality of different times. The computer analyzes the streaked pattern of electrons and mathematically reconstructs the plurality of images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.