Solid-state imaging element, method for manufacturing solid-state imaging element, and electronic apparatus
US11240450B2 · kind B2 · utility
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15Claims
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Key dates
| Filing date | May 21, 2018 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | May 21, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/8057
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Provided is a solid-state imaging element including a plurality of pixels that includes at least two phase difference detection pixels for focus detection. Each pixel has a stacked structure including a plurality of photoelectric conversion elements that are stacked on top of each other and absorb light beams different in wavelength from one another to generate electrical charges, and each phase difference detection pixel includes, in the stacked structure, a color filter that partially covers an upper face of one of the photoelectric conversion elements and absorbs a light beam with a specific wavelength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.