Measurement apparatus and method for analyzing a measurement signal
US11243684B2 · kind B2 · utility
0Cited by
3References
13Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 17, 2019 |
| Grant date | Feb 8, 2022 |
| Priority date | — |
| Expiry date | Dec 17, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an enhanced control of a measurement device displaying a signal waveform of a measurement signal. For this purpose, the waveform of the measurement signal is displayed on a touch-screen. The touch-screen receives multi-digit touch gestures comprising at least two touch gestures. The touch gestures of the multi-digit touch gesture are analyzed in order to determine simultaneously an operation and a range of the measurement signal on which the determined operation has to be applied. In this way, the control of the measurement device can be simplified.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.