Semiconductor apparatus and method for controlling semiconductor apparatus
US11244711B2 · kind B2 · utility
5Cited by
3References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 12, 2020 |
| Grant date | Feb 8, 2022 |
| Priority date | — |
| Expiry date | Mar 12, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L25/0657
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to one embodiment, there is provided a semiconductor apparatus including a first chip and a second chip. The first chip is electrically connected to a terminal to which a signal from a host device is input. The second chip is electrically connected to the first chip. The second chip has a first duty adjustment circuit. The first chip has a second duty adjustment circuit. The first duty adjustment circuit performs first calibration operation in a first period. The second duty adjustment circuit performs second calibration operation in a second period. The first period and the second period have an overlapping period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.