Systems and methods for focus control in x-rays
US11246208B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 29, 2019 |
| Grant date | Feb 8, 2022 |
| Priority date | — |
| Expiry date | Mar 4, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/58
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.