Optical element fabrication with optical scanner feedback
US11247422B2 · kind B2 · utility
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16Claims
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Key dates
| Filing date | Aug 28, 2019 |
| Grant date | Feb 15, 2022 |
| Priority date | — |
| Expiry date | Dec 27, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/133528
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A computer-implemented method for optical element fabrication with optical scanner feedback includes initiating the optical scanner to obtain an optical measurement of an optical layer of a multi-layer film. A rotational orientation for an optical element that is to be cut from the multi-layer film is then determined based on the optical measurement. The method also includes initiating a cutting instrument to cut the optical element from the multi-layer film at the rotational orientation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.