Patent · US Active

Device and method for determining the microstructure of a metal product, and metallurgical installation

US11249037B2 · kind B2 · utility

0Cited by

3References

12Claims

0Family size

Assignee

SMS group GmbH · DE

Inventors

Mostafa Biglari · Stuttgart, DE
Ulrich Sommers · Düsseldorf, DE
Christian Klinkenberg · Herdecke, DE
Michel Renard · Grenoble, FR
Guy Raymond · Ivoz-Ramet, BE
Oliver Pensis · Montegnée, BE
Tobias Terlau · Wülfrath, DE
Horst Krauthäuser · Oberkochen, DE

Key dates

Filing date	May 24, 2017
Grant date	Feb 15, 2022
Priority date	—
Expiry date	May 24, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/6462
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.