Method for determining a bias affecting pixels of a pixelated detector of ionizing radiation
US11249205B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 22, 2020 |
| Grant date | Feb 15, 2022 |
| Priority date | — |
| Expiry date | Dec 22, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/241
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A method for determining a bias (βi,j) affecting at least one pixel of a detector (1) of ionizing radiation, the detector comprising a plurality of pixels (10i,j), each pixel being configured to collect charge carriers (6) generated by an interaction of the ionizing radiation in the detector, and to form a pulsed signal under the effect of the generation and collection of the charge carriers, the pixels being distributed in a matrix array, the method comprising:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.