Methods and systems for measurement of components
US11255748B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2019 |
| Grant date | Feb 22, 2022 |
| Priority date | — |
| Expiry date | Mar 26, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M15/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure relates to methods and systems for measuring a component. First measurements for a plurality of features of the component are obtained from a first measurement instrument. Second measurements for at least one of the plurality of features of the component are obtained from a second measurement instrument, the second measurement instrument having a higher measurement resolution than the first measurement instrument. A scaling factor for the at least one of the plurality of features, which relates the first measurements to the second measurements, is determined. Scaled measurements for the plurality of features of the component are generated by applying the scaling factor to the first measurements. The scaled measurements are output as measurements of the component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.