Electrical parameter detection method, chip, consumable, and image forming apparatus
US11256206B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 28, 2021 |
| Grant date | Feb 22, 2022 |
| Priority date | — |
| Expiry date | Jun 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G2215/00632
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The present disclosure provides an electrical parameter detection method, a chip, a consumable, and an image forming apparatus. The electrical parameter detection method includes: configuring an installation detecting pin to be at a high level by an image forming control unit; controlling a voltage of an installation detecting terminal to be at a low level by a chip control unit, such that a current loop is formed between the image forming apparatus and the chip; and determining, by the image forming apparatus, whether the image forming apparatus is in a desired contact with the chip according to an electrical parameter of the current loop.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.