Patent · US Active

Correction of non-imaging thermal measurement devices

US11260454B2 · kind B2 · utility

1Cited by
7References
20Claims
0Family size

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Key dates

Filing dateNov 6, 2018
Grant dateMar 1, 2022
Priority date
Expiry dateMar 11, 2040

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P10/25
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

A system and a corresponding method of correcting temperature data from a non-imaging optical sensor involve collecting temperature data generated using the optical sensor. The temperature data describes temperature changes across a surface of a material during an additive manufacturing operation in which the material is heated by a heat source. The method includes estimating a size of a hot spot corresponding to a hottest region formed on the surface by the heat source; and estimating a size of a heated region corresponding to a locus of points within the field of view that contribute to the temperature data. The method further includes correcting the temperature data based on the estimated sizes of the hot spot and the heated region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.