Tip-enhanced Raman spectroscope system

US11268978B2 · kind B2 · utility

Assignee

• NATIONAL INSTITUTE OF METROLOGY, CHINA · CN

Inventors

• Zhen-Dong Zhu · Beijing, CN
• Si Gao · Lo Wu, CN
• Wei Li · Liyang City, CN
• Shi-Gang Li · Beijing, CN
• Jing XU · Beijing, CN

Key dates

• Filing date: Sep 26, 2019
• Grant date: Mar 8, 2022
• Expiry date: Feb 10, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2003/2806
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present disclosure provides a tip-enhanced Raman spectroscope system. The system includes a laser emitting unit, a laser excitation unit, a first dichroic beam splitter, a first Raman spectrometer, and a confocal detecting unit. The laser excitation unit includes a sample stage and a first scanning probe. The sample stage is configured to have a sample disposed thereon such that a first incident laser beam emitted from the laser emitting unit is transmitted to the sample to excite first scattered light. The first dichroic beam splitter is configured to split a first Raman scattered light from the first Rayleigh scattered light. The first Raman spectrometer is disposed on a first Raman optical path of the first Raman scattered light. The confocal detecting unit is disposed on a first Rayleigh optical path of the first Rayleigh scattered light to image the sample.