Patent · US Active

Method and system for terahertz radiation detection and characterization

US11274969B2 · kind B2 · utility

0Cited by

2References

21Claims

0Family size

Assignee

INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE · CA

Inventors

Tsuneyuki Ozaki · Brossard, CA
Xin-Sheng Chai · Montréal, CA

Key dates

Filing date	Jul 14, 2017
Grant date	Mar 15, 2022
Priority date	—
Expiry date	Jan 26, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01J9/02
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A characterization and detection method and system, the system comprising a terahertz beam source, a probe beam source, a detection crystal receiving a probe beam from the probe beam source and a terahertz beam from the terahertz beam source, the probe beam and the terahertz beam co-propagating collinearly through the detection crystal, and a polarizer analyser receiving the pump beam transmitted from the detection crystal, wherein the polarizer analyser comprises two liquid crystal variable retarders and a linear polarizer, the polarizer analyzer analyzing a phase delay and orientation changes of the principle axes of the probe beam induced by the THz electric field and polarization.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.