Method and device for testing thermal conductivity of nanoscale material
US11275041B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2018 |
| Grant date | Mar 15, 2022 |
| Priority date | — |
| Expiry date | Jan 29, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and device for testing the thermal conductivity of a nanoscale material 1. The method comprises the following steps: preparing or placing a nanoscale material 1 to be tested on a substrate and plating an electrode 2 at both ends thereof; determining a resistance temperature coefficient R′ of the nanoscale material 1 to be tested and a resistance R0 at the ambient temperature T0; generating a small signal voltage V3ω with a frequency being 3ω on the nanoscale material 1 to be tested; and measuring the small signal voltage V3ω, and in conjunction with each piece of test data, calculating, according to a formula, the thermal conductivity κ of the nanoscale material to be tested 1 at the ambient temperature T0.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.