Anti-reflective film
US11275199B2 · kind B2 · utility
1Cited by
23References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2020 |
| Grant date | Mar 15, 2022 |
| Priority date | — |
| Expiry date | Mar 11, 2040 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC09D7/61
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an anti-reflective film exhibiting one or more peaks (qmax) at a scattering vector of 0.0758 to 0.1256 nm−1, in a graph showing a log value of scattering intensity to a scattering vector defined in small-angle X-ray scattering.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.