Three-dimensional measuring system and measuring method with multiple measuring modes
US11280605B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 5, 2019 |
| Grant date | Mar 22, 2022 |
| Priority date | — |
| Expiry date | Jun 5, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention relates to the field of three-dimensional digital imaging, and more particularly to a three-dimensional measuring system and a measuring method with multiple measuring modes. The measuring system includes a control unit, a variable digital pattern generation unit, an image processing unit, a calculating unit and at least one image sensor; the control unit is used for controlling the cooperative work of the whole measuring system; the variable digital pattern generation unit includes a memory and a projector, and the memory stores a plurality of light template digital patterns; the image sensors are used for acquiring patterns which are projected onto a surface of a measured object; the image processing unit is a multi-mode digital image processor; and the calculating unit is a multi-mode three-dimensional point cloud calculator. The three-dimensional measuring system and the measuring method with multiple measuring modes of the present invention can implement the high-precision and high-detail three-dimensional measurement or handheld real-time measurement by switching the measuring modes, thereby having a wide application range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.