Measurement system
US11280645B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2019 |
| Grant date | Mar 22, 2022 |
| Priority date | — |
| Expiry date | Oct 9, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various examples are directed to methods and system of managing a sensor. A measurement system may receive from the host device, a first register map describing a first configuration of the measurement system for the first sensor. The first configuration may indicate a first measurement frequency for the first sensor. The measurement system may configure a switch matrix to provide a first excitation signal to the first sensor. The measurement system may configure the switch matrix to connect an analog-to-digital converter (ADC) of the measurement system to the first sensor. The measurement system may sample a first raw sensor signal from the first sensor with the ADC at a first measurement frequency described by the first configuration. The measurement system may generate first digital measurement data based at least in part on the first raw sensor signal and send the first digital measurement data to the host device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.