Method, system and apparatus for a Raman spectroscopic measurement system
US11280675B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jun 15, 2020 |
| Grant date | Mar 22, 2022 |
| Priority date | — |
| Expiry date | Jul 16, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A chip-based planar Raman spectroscopic measurement system is disclosed comprising at least a semiconductor laser as excitation light source, an output waveguide coupling and delivering laser light out of chip, a photo-detector monitoring the laser optical power, an input waveguide coupling signal light to chip, a planar spectrometer comprising Planar Waveguide Grating (PWG) and an array photo-detectors, and control electronics. In some embodiments the PWG is a fixed frequency Arrayed Waveguide Grating (AWG), the laser is frequency-tunable. In other embodiments, the laser has fixed frequency, the PWG or the AWG is frequency tunable. In either case, the frequency tunability will ensure the recapture of the spectral information missed due to the spectral characteristics of the planar waveguide grating such as the channel spacing of the AWG, resulting in high channel count and high-resolution Raman measurement of sufficient spectral range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.