Device and method for analyzing a material

US11280728B2 · kind B2 · utility

Assignee

• DiaMon Tech AG · DE

Inventors

• Alexander Bauer · Rosenheim, DE
• Otto Hertzberg · Frankfurt am Main, DE
• Thorsten Lubinski · Berlin, DE

Key dates

• Filing date: Dec 7, 2016
• Grant date: Mar 22, 2022
• Expiry date: Dec 7, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2021/1725
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).