Circuit, semiconductor device and method for parameter PSRR measurement
US11280847B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 30, 2020 |
| Grant date | Mar 22, 2022 |
| Priority date | — |
| Expiry date | Oct 30, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05F1/56
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A circuit for parameter PSRR measurement includes a filter, a first regulator and a second regulator. The filter may be configured for receiving an AC input signal and a DC input signal, and for outputting a combined output signal according to the AC input signal and the DC input signal. The first regulator may be configured for receiving the combined output signal, and for outputting a first output signal having a first AC component signal and a first DC component signal. The second regulator may be configured for receiving the first output signal, and for outputting a second output signal having a second AC component signal and a second DC component signal. A parameter PSRR of the second regulator may be obtained according to the first AC component signal and the second AC component signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.