Semiconductor device and resistance measurement system
US11283462B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2020 |
| Grant date | Mar 22, 2022 |
| Priority date | — |
| Expiry date | Sep 6, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K17/955
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A semiconductor device includes first and second terminals, a reference resister being coupled between the first and second terminals, third and fourth terminals, a sensor resister being coupled between the third and fourth terminals, a first buffer which supplies a first reference voltage to the first terminal, a second buffer which supplies a second reference voltage to the fourth terminal, a reference voltage generation circuit which supplies one of first and second voltages alternately in a time division manner as the first reference voltage and supplies the other as the second reference voltage, a first analog-to-digital conversion circuit which performs analog-to-digital conversion on a signal line coupled to the third terminal, an RC filter disposed on the signal line, a noise detector which detects noise of the signal line, wherein a time constant of the RC filter is changed based on a result of the noise detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.