Patent · US Active

Temperature-compensated strain gauge measurements

US11287347B2 · kind B2 · utility

0Cited by
11References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 29, 2020
Grant dateMar 29, 2022
Priority date
Expiry dateSep 25, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L25/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device for measuring a strain of an object independently of temperature variations includes: at least one strain gauge that is attachable directly or indirectly to the object whose strain is to be measured; a first temperature sensor for measuring a temperature of the at least one strain gauge; read-out electronics for measuring a change of electrical resistance of the at least one strain gauge as a measured electrical resistance change, the read-out electronics including at least one fixed resistor whose value is relied upon when obtaining a value of the change of electrical resistance of the strain gauge as a result of the measurement, the read-out electronics being such that a temperature of the at least one fixed resistor is known and/or obtainable by measurement; and an evaluation unit for: correcting the measured electrical resistance change, and/or a strain of the strain gauge and/or the strain of the object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.