System and method for electromagnetic beamforming and imaging at low frequency
US11287390B1 · kind B1 · utility
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21Claims
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Key dates
| Filing date | Jan 30, 2020 |
| Grant date | Mar 29, 2022 |
| Priority date | — |
| Expiry date | Sep 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/003
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A technique for measuring properties of a material includes measuring the electromagnetic radiation scattered by one or more scattering points associated with the material, and adjusting the radiation according to the respective sensitivities of the scattering points to changes in material properties at that scattering point for several pairs of radiation sources and receivers. The material properties are determined using the updated measurements and corresponding simulated measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.