System and method for measuring time-frequency characteristic of high-frequency electromagnetic signal
US11287457B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 11, 2018 |
| Grant date | Mar 29, 2022 |
| Priority date | — |
| Expiry date | Mar 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F2203/54
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
This invention disclosed a system and method for characteristics measurement of electromagnetic signals. The measurement system comprises a multi-repetition-rate pulsed light source, a frequency mixer for electrical signal and optical signal, and a data acquisition and processing device. The measurement system accurately determines the characteristic information of the signal to be measured, such as frequency, phase, intensity, and their variations, by measuring the low frequency mixed signal generated by the multi-repetition-rate pulsed light source and the signal to be measured in the frequency mixer. This system has the advantages of simple structure, high measurement accuracy, low cost and large measurable frequency range. The system can be applied to the measurement of various electromagnetic signals, covering the spectral range from microwave, millimeter wave, to terahertz and even light wave.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.