Patent · US Active

Test case selection

US11288173B1 · kind B1 · utility

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20Claims
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Assignee

Inventors

Key dates

Filing dateSep 22, 2020
Grant dateMar 29, 2022
Priority date
Expiry dateSep 22, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q10/06395
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Test case selection methods are disclosed. A feature of a candidate test case and respective features of a set of test cases are extracted. The set of test cases is clustered into a plurality of clusters based on the respective features of the set of test cases. At least one cluster related to the candidate test case is determined from the plurality of clusters based on the feature of the candidate test case. At least one test case similar to the candidate test case is selected from a plurality of test cases included in the at least one cluster.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.