Mass spectrometry analysis method and mass spectrometry system
US11289318B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2021 |
| Grant date | Mar 29, 2022 |
| Priority date | — |
| Expiry date | Mar 25, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2030/027
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a mass spectrometry analysis method and a mass spectrometry system. During implementation of the mass spectrometry analysis method, intensity data of the daughter ions, a first parameter of the daughter ions associated with the first physicochemical property, and a second parameter of the daughter ions associated with the second physicochemical property are all recorded to form a spectrogram data set. In a deconvolution step, the spectrogram data set is deconvoluted to categorize the daughter ions from the same parent ion according to two-dimensional features including the first parameter and the second parameter. In the above manner, the mass spectrometry analysis method and the mass spectrometry system provided by the invention can detect ions that partially overlap spectral peaks of other ions significantly, thereby improving the qualitative and quantitative ability of data analysis for data independent acquisition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.