Patent · US Active

Integrated analysis device analysis techniques

US11292713B2 · kind B2 · utility

0Cited by
5References
20Claims
0Family size

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Inventors

Key dates

Filing dateMay 1, 2020
Grant dateApr 5, 2022
Priority date
Expiry dateMay 1, 2040

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/4981
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Provided are integrated analysis devices having features of macroscale and nanoscale dimensions, and devices that have reduced background signals and that reduce quenching of fluorophores disposed within the devices. Related methods of manufacturing these devices and of using these devices are also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.