Texture analyzer

US11293743B2 · kind B2 · utility

Assignee

• AMETEK, INC. · US

Inventors

• Alex Mak · Los Altos Hills, US
• Arief Raja · Bengaluru, IN
• Charles Falzarano · Lakeville, US
• Shali Avidzba · Sudbury, US
• Kerri Topham · Attleboro, US

Key dates

• Filing date: Dec 16, 2019
• Grant date: Apr 5, 2022
• Expiry date: Nov 26, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N3/08
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A texture analyzer having a support structure including a base plate, a carriage support, and a moveable carriage that receives a load cell module; a fixture to receive a sample between the base plate and the load cell module; a memory storing support structure and load cell module deflection parameters; and a processor. The processor is configured to identify the load cell module, retrieve the support structure deflection parameters and one of multiple load cell module deflection parameters, obtain raw measurement signals from the load cell module, and refine the raw measurement signals to compensate for deflection in the load cell module using the retrieved load cell module deflection parameters and support structure deflection parameters.