Method for correcting a primary measurement signal detected by an optical sensor
US11293800B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Jun 5, 2020 |
| Grant date | Apr 5, 2022 |
| Priority date | — |
| Expiry date | Jun 5, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/121
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure includes a method for correcting a primary measurement signal detected by an optical detector. The method includes: emitting a first light signal from a light source to an active sensor layer such that the active sensor layer is stimulated and emits a second light signal, which is detected by an optical detector; determining the primary measurement signal of a primary measurement parameter based on the second light signal and/or the first light signal; determining a secondary measurement signal of a secondary measurement parameter that is different from the primary measurement parameter based on the first light signal or the second light signal; comparing the determined secondary measurement signal with a first limit value; and correcting the primary measurement signal when the secondary measurement signal exceeds the first limit value, wherein correcting the primary measurement signal comprises smoothing the primary measurement signal by filtering.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.