Patent · US Active

X-ray examination arrangement and method for operating an x-ray examination arrangement

US11298089B2 · kind B2 · utility

0Cited by

9References

10Claims

0Family size

Assignee

Carl Zeiss Industrielle Messtechnik GmbH · DE

Inventors

Marco Erler · Oberkochen, DE
Daniel Weiss · Oberkochen, DE
Martin Krenkel · Aalen, DE
Wolfgang Kimmig · Aalen, DE

Key dates

Filing date	Feb 22, 2020
Grant date	Apr 12, 2022
Priority date	—
Expiry date	Feb 22, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/501
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An x-ray examination arrangement includes an x-ray radiation source arranged at a source position, at least two x-ray detectors having active detector areas and being arranged such that the active detector areas capture different solid angle ranges with respect to x-ray radiation produced by the x-ray radiation source and emanating from the source position, and a control device configured to calculate a projection onto a virtual detector plane based on radiographs respectively captured by the at least two x-ray detectors and spatial poses of the at least two x-ray detectors relative to the source position, and provide a combined radiograph for the virtual detector plane based on the projection. In addition, a method for operating the x-ray examination arrangement and a computed tomography device are provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.