Pointer recognition for analog instrument image analysis
US11301712B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 2019 |
| Grant date | Apr 12, 2022 |
| Priority date | — |
| Expiry date | Oct 14, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and processes for identifying a pointer in an image of an analog instrument are provided herein. An instrument contour in the image corresponding to the analog instrument may be identified. A plurality of candidate pointer contours in the image may be identified and screened using one or more geometric property screening techniques including an evaluation of a geometric area, a distance parameter, and/or a gravity center of the plurality of candidate pointer contours. Principal component analysis (PCA) may be performed to select an identified pointer contour from among the reduced plurality of candidate pointer contours. A linear regression model may be applied to pixel points in the contour area of the identified pointer contour and a slope and angle of an associated pointer represented by the identified pointer contour may be determined based on an output of the linear regression model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.