Technologies for high resolution and wide swath spectrometer
US11307097B1 · kind B1 · utility
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20Claims
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Key dates
| Filing date | Oct 13, 2020 |
| Grant date | Apr 19, 2022 |
| Priority date | — |
| Expiry date | Oct 22, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/4538
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Technologies for a high resolution and wide swath spectrometer are disclosed. In the illustrative embodiment, an inverted image slicer converts a linear field of view into a grid shape, allowing for an interferometer of a Fourier transform spectrometer to operate on a narrow range of field of views, improving the average spectral resolution of the spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.