Patent · US Active

Quality detection device, quality detection method, and integrated probe assembly

US11307160B2 · kind B2 · utility

0Cited by

7References

9Claims

0Family size

Assignee

HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD. · CN

Inventors

Sheng Wang · 红钢城街道, CN
Hao Liu · Beijing, CN
Da Hu · Louisville, US
Yong Hu · Longbeilingcun, CN
Peng Lei · Redmond, US
Ji Guo Liu · Nanhu, CN
Zuo Xu · Qinhuangdao City, CN
Yun Feng Gao · Nanhu, CN

Key dates

Filing date	Apr 22, 2020
Grant date	Apr 19, 2022
Priority date	—
Expiry date	Apr 23, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG05B19/05
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present disclosure relates to a welding quality detecting field, and specifically relates to a quality detection device. The quality detection device includes an integrated probe set, a driving module and a collecting module. The integrated probe set includes a plurality of integrated probe assemblies. The integrated probe assemblies are disposed in pairs and each integrated probe assembly includes a driving end and a collecting end. The driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly. The collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.