Measurement system and method for determining a phase and amplitude influence of a device under test
US11307231B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2019 |
| Grant date | Apr 19, 2022 |
| Priority date | — |
| Expiry date | Jun 1, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2837
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system for determining a phase and amplitude influence of a device under test, comprising a measurement instrument having a signal generator, a local oscillator, a first mixer and an analysis unit is disclosed. The signal generator is configured to generate a source signal with a predetermined source frequency and a source phase, and to forward the source signal to the device under test, wherein the source signal is altered by the device under test in at least one of amplitude and phase, such that a measurement signal is generated and forwarded to the first mixer. The local oscillator is configured to generate a local oscillator signal with a predetermined local oscillator frequency and a local oscillator phase, and to forward the local oscillator signal to the first mixer. The first mixer is configured to mix the measurement signal and the local oscillator signal, thereby generating a first mixer signal. The analysis unit is located downstream of the first mixer and is configured to analyze the first mixer signal or a processed version of the first mixer signal. The measurement instrument is configured to perform at least two measurements of the phase and amplitude i…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.