Apparatus and method for system profile learning in an information handling system
US11308417B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 2017 |
| Grant date | Apr 19, 2022 |
| Priority date | — |
| Expiry date | Oct 14, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N7/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An information handling system includes a processing system including a first sensor, and a second sensor, and a management system including an anomaly table, a learned model table entry associated with the processing system and including a learned model and a first sensor data history, and a prediction module to implement a prediction algorithm. The management system is configured to: receive first sensor data and second sensor data, determine an estimate of a first value of the first sensor data using a second value of the second sensor data, determine a residual of the first value by a comparison of the estimate to the first value, determine a significance of the residual, where the significance having a significant value is associated with a predicted anomaly, determine that an anomaly table entry has a known anomaly class for the predicted anomaly, and perform a remediation plan to resolve the predicted anomaly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.