Gain cell embedded DRAM in fully depleted silicon-on-insulator technology
US11309008B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 9, 2019 |
| Grant date | Apr 19, 2022 |
| Priority date | — |
| Expiry date | Jul 9, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/4016
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An FD-SOI GC-edRAM gain cell includes: The FD-SOI transistors are interconnected to form a storage node for retaining a data signal. The bodies of at least two of the transistors are coupled in a single well to a body voltage terminal. The write trigger signal triggers writing an input data signal from the write bit line terminal to the storage node and the read trigger signal triggers outputting the retained data signal from the storage node to the read bit line terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.