Patent · US Active

Ionization method, ionization device, imaging spectrometry method, and imaging spectrometer

US11309174B2 · kind B2 · utility

0Cited by

6References

25Claims

0Family size

Assignee

Shimadzu Corporation · JP

Inventors

Kenichi Taniguchi · Yokkaichi, JP
Takeshi Uchida · Hiratsuka, JP
Hiroto Itoi · Kyoto, JP

Key dates

Filing date	Nov 18, 2016
Grant date	Apr 19, 2022
Priority date	—
Expiry date	Nov 18, 2036

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/26
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Provided is an ionization method for ionizing a sample 21 adhered to a tip of a probe 11 that is electrically conductive, by applying an ionization voltage to the probe 11 to electrically charge the sample 21. The ionization method includes: subjecting the probe 11 to treatment to make a surface of the probe 11 homogenous; causing adhesion of the sample 21 to the tip of the probe 11; and ionizing the sample 21 by applying the ionization voltage to the probe 11 to electrically charge the sample 21. The treatment for making the surface of the probe 11 homogenous can be implemented by, for example, causing corona discharge at the probe 11.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.