Digital grip gauge with shaped tip

US11313660B2 · kind B2 · utility

Assignee

• Lockheed Martin Corporation · US

Inventors

• Jonathan Richard Olson · Fort Worth, US
• Tyler Martin Rup · Fort Worth, US
• Philip Michael Chovanec · Arlington, US
• Matthew Timothy McKee · Fort Worth, US
• Alondra Renee Guevara · Fort Worth, US
• Carl Bargainer · Fairview, US
• Glynn R. Bartlett · Boerne, US
• Thomas E. Lyons, Jr. · Helotes, US
• J. Mark Major · San Antonio, US
• Ryan McBee · San Antonio, US
• Paul Wood · Warren, US
• Stephen L. Wiedmann · San Antonio, US

Key dates

• Filing date: Mar 30, 2020
• Grant date: Apr 26, 2022
• Expiry date: May 3, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B2210/58
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In an embodiment, an apparatus includes one or more probes, a tip, a pin, and a measurement device. The one or more probes may be configured for insertion through an aperture in a component. The tip may be slidably engaged with the one or more probes and include a first end configured to contact a first surface of the component. The first end of the tip may be conically shaped. The pin may be slidably engaged with the one or more probes and include a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component. The pin may be configured to move between a first position and a second position. An axis of the pin may be substantially aligned with an axis of the tip. The measurement device may be coupled to the tip and configured to measure a value indicating a grip length.