Three-dimensional measurement apparatus, three-dimensional measurement method, and three-dimensional measurement non-transitory computer readable medium
US11313676B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2019 |
| Grant date | Apr 26, 2022 |
| Priority date | — |
| Expiry date | Mar 15, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/73
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The three-dimensional measurement apparatus includes a projecting unit configured to project patterned light onto a measurement target and an image capturing unit configured to capture an image of the measurement target onto which the patterned light is projected, with a predetermined exposure time, a calculation unit configured to calculate positions of a three-dimensional point group expressing a three-dimensional shape of the measurement target based on the feature points included in the image, and a determination unit configured to determine the exposure time such that at least one of the number of feature points and the number of three-dimensional point groups is equal to or greater than a threshold that is defined based on one of their maximum numbers, and the exposure time is shorter than an exposure time for the maximum number.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.